IC semiconductor X-Ray inspection system X7600
IC semiconductor X-Ray inspection system X7600 X-Ray inspection system is high-precision detection equipment. It inspects and analyzes the inner structure of the object without damage via the penetration power from X-Ray. It has been widely applied to BGA detection , LED, SMT, semiconductor, battery, automotive electronics, ceramic products, casting, plastic, connectors, 2.5D image analysis, pharmaceutical products and other industries. –Inspection of internal cracks and Defects analysis of internal conditions (Analysis of internal displacements) SMT/Semicon/Solar/Conn/LED High-definition image: Slanting/Bridge/Voids/Cold Solder/Bonding wire 100KV 3um (130 KV Optional)closed X-ray tube,long life time,maintenance in free 2.3 mllion high resolution digital flat panel detector 6 axis linkage system. 60 degrees observation Platform 360° rotation Color lmage Navigation & Mapping Navigation Mapping Mosaic Function.(optional ) Scalable 3D module(industrial ...
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